Show simple item record

dc.contributor.authorLuo, Qiwu
dc.contributor.authorHe, Yigang
dc.contributor.authorSun, Yichuang
dc.date.accessioned2019-01-09T14:45:02Z
dc.date.available2019-01-09T14:45:02Z
dc.date.issued2018-11-07
dc.identifier.citationLuo , Q , He , Y & Sun , Y 2018 , ' Time-efficient fault detection and diagnosis system for analog circuits ' , Automatika , vol. 59 , no. 3 , pp. 303-311 . https://doi.org/10.1080/00051144.2018.1541644
dc.identifier.issn0005-1144
dc.identifier.otherPURE: 15954067
dc.identifier.otherPURE UUID: 3f423381-9b36-4095-bd50-08dae4a0a29b
dc.identifier.otherScopus: 85060917807
dc.identifier.urihttp://hdl.handle.net/2299/20944
dc.description.abstractTime-efficient fault analysis and diagnosis of analog circuits are the most important prerequisites to achieve online health monitoring of electronic equipments, which are involving continuing challenges of ultra-large-scale integration, component tolerance, limited test points but multiple faults. This work reports an FPGA (field programmable gate array)-based analog fault diagnostic system by applying two-dimensional information fusion, two-port network analysis and interval math theory. The proposed system has three advantages over traditional ones. First, it possesses high processing speed and smart circuit size as the embedded algorithms execute parallel on FPGA. Second, the hardware structure has a good compatibility with other diagnostic algorithms. Third, the equipped Ethernet interface enhances its flexibility for remote monitoring and controlling. The experimental results obtained from two realistic example circuits indicate that the proposed methodology had yielded competitive performance in both diagnosis accuracy and time-effectiveness, with about 96% accuracy while within 60 ms computational time.en
dc.language.isoeng
dc.relation.ispartofAutomatika
dc.rightsOpen
dc.titleTime-efficient fault detection and diagnosis system for analog circuitsen
dc.contributor.institutionCommunications and Intelligent Systems
dc.contributor.institutionCentre for Engineering Research
dc.contributor.institutionSchool of Engineering and Technology
dc.description.statusPeer reviewed
dc.description.versiontypeFinal Published version
dcterms.dateAccepted2018-11-07
rioxxterms.versionVoR
rioxxterms.versionofrecordhttps://doi.org/10.1080/00051144.2018.1541644
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue
herts.rights.accesstypeOpen


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record