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Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST
Omana, Martin; Rossi, Daniele; Beniamino, Edda; Metra, Cecilia; Tirumurti, Chandra; Galivanche, Rajesh (2016-08-31)During at-speed test of high performance sequential ICs using scan-based Logic BIST, the IC activity factor (AF) induced by the applied test vectors is significantly higher than that experienced during its in field operation. ...