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    • Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs 

      Tenentes, Vasileios; Rossi, Daniele; Khursheed, Saqib; Al-Hashimi, Bashir M.; Chakrabarty, Krishnendu (2018-04-01)
      Manufacturing defects that do not affect the functional operation of low power integrated circuits (ICs) can nevertheless impact their power saving capability. We show that stuck-ON faults on the power switches and resistive ...