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Browsing by Author "Kandl, S."
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Development of a framework for automated systematic testing of safety-critical embedded systems
Kandl, S.; Kirner, Raimund; Puschner, P. (Institute of Electrical and Electronics Engineers (IEEE), 2006)In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the ...