Now showing items 1-2 of 2

    • Automated formal verification and testing of C programs for embedded systems 

      Kandl, Susanne; Kirner, Raimund; Puschner, Peter (Institute of Electrical and Electronics Engineers (IEEE), 2007)
      In this paper, we introduce an approach for automated verification and testing of ANSI C programs for embedded systems. We automatically extract an automaton model from the C code of the SUT (system under test). This ...
    • Error Detection Rate of MC/DC for a Case Study from the Automotive Domain 

      Kandl, Susanne; Kirner, Raimund (Springer Nature, 2010)
      Chilenski and Miller [1] claim that the error detection probability of a test set with full modified condition/decision coverage (MC/DC) on the system under test converges to 100% for an increasing number of test cases, ...