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    • Impact of Bias Temperature Instability on Soft Error Susceptibility 

      Rossi, Daniele; Omana, Martin; Metra, Cecilia; Paccagnella, Alessandro (2015-04-30)
      In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft error (SE) susceptibility. In particular, we consider bias temperature instability (BTI), namely negative BTI in pMOS transistors ...