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dc.contributor.authorBevilacqua, Mose
dc.contributor.authorJackman, Richard B.
dc.date.accessioned2013-09-23T13:30:06Z
dc.date.available2013-09-23T13:30:06Z
dc.date.issued2009
dc.identifier.citationBevilacqua , M & Jackman , R B 2009 , ' Extreme sensitivity displayed by single-crystal diamond deep ultra-violet photoconductive devices ' , Applied Physics Letters , vol. 95 , no. 24 , 243501 . https://doi.org/10.1063/1.3273378
dc.identifier.issn0003-6951
dc.identifier.otherPURE: 2231576
dc.identifier.otherPURE UUID: d69c954c-4c7b-4012-84ca-58e59aad0dbc
dc.identifier.otherScopus: 77956153332
dc.identifier.urihttp://hdl.handle.net/2299/11629
dc.description.abstractDeep UV detection using a single crystal diamond (SCD) substrate without a homoepitaxial layer has been demonstrated using a defect passivation treatment. Despite evidence of surface damage on the SCD, the treatments lead to highly effective photoconductive devices, displaying six-orders of discrimination between deep UV and visible light and a responsivity as high as 100 A/W, equivalent to an external quantum efficiency of 700, similar to the best values for devices based on high quality homoepitaxial layers. Impedance spectroscopic investigations suggest that the treatment used reduces the impact of less resistive surface material, most likely defects left from substrate polishingen
dc.format.extent3
dc.language.isoeng
dc.relation.ispartofApplied Physics Letters
dc.titleExtreme sensitivity displayed by single-crystal diamond deep ultra-violet photoconductive devicesen
dc.contributor.institutionMaterials and Structures
dc.contributor.institutionSchool of Physics, Engineering & Computer Science
dc.contributor.institutionDepartment of Engineering and Technology
dc.contributor.institutionCentre for Engineering Research
dc.contributor.institutionEnergy and Sustainable Design Research Group
dc.description.statusPeer reviewed
rioxxterms.versionofrecordhttps://doi.org/10.1063/1.3273378
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue


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