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dc.contributor.authorMartin, William Eugene
dc.identifier.citationMartin , W E 1974 , ' Refractive index profile measurements of diffused optical waveguides ' , Applied Optics , vol. 13 , no. 9 , pp. 2112-2116 .
dc.identifier.otherPURE: 1996248
dc.identifier.otherPURE UUID: cbde9944-4364-4043-a884-8aab2304affc
dc.identifier.otherScopus: 0016101683
dc.description.abstractRefractive index profiles resulting from the fabrication of optical waveguides by diffusion techniques are measured using a reflection interferometric technique. In Cd-diffused ZnSe waveguides, the index variations are found to be complementary error functions that closely follow the composition changes for deep ( greater than 5 mu m) diffusions. Shallow ( less than 5 mu m) diffusions produce waveguides in which the index profile is a complementary error function that differs significantly from the composition profile. The relationship between composition and refractive index is determined for Cd compositions less than 10%. Refractive index profiles in commercially available diffused glass waveguides (SELFOC rod and fibers) are also described.en
dc.relation.ispartofApplied Optics
dc.titleRefractive index profile measurements of diffused optical waveguidesen
dc.contributor.institutionSchool of Physics, Astronomy and Mathematics
dc.contributor.institutionScience & Technology Research Institute
dc.description.statusPeer reviewed
dc.relation.schoolSchool of Physics, Astronomy and Mathematics
rioxxterms.typeJournal Article/Review

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