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dc.date.accessioned2015-01-15T09:47:41Z
dc.date.available2015-01-15T09:47:41Z
dc.date.issued1992-09-30
dc.identifier.citationLudlow , I & Kaye , P H Sept. 30 1992 , Particle Asymmetry Analyser , Patent No. EP0316171 B1 .
dc.identifier.otherPURE: 2178463
dc.identifier.otherPURE UUID: 0f8e40f0-e24a-45ba-bc2b-2855937a6213
dc.identifier.otherORCID: /0000-0001-6950-4870/work/32372071
dc.identifier.urihttp://hdl.handle.net/2299/15215
dc.language.isoeng
dc.titleParticle Asymmetry Analyseren
dc.contributor.institutionParticle Instruments and diagnostics
dc.contributor.institutionSchool of Engineering and Technology
dc.contributor.inventorLudlow, Ian
dc.contributor.inventorKaye, Paul H.
rioxxterms.versionVoR
rioxxterms.typeOther
herts.preservation.rarelyaccessedtrue


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