| dc.date.accessioned | 2015-01-15T09:47:41Z | |
| dc.date.available | 2015-01-15T09:47:41Z | |
| dc.date.issued | 1992-09-30 | |
| dc.identifier.citation | Ludlow , I & Kaye , P H Sept. 30 1992 , Particle Asymmetry Analyser , Patent No. EP0316171 B1 . | |
| dc.identifier.other | ORCID: /0000-0001-6950-4870/work/32372071 | |
| dc.identifier.uri | http://hdl.handle.net/2299/15215 | |
| dc.format.extent | 459682 | |
| dc.language.iso | eng | |
| dc.title | Particle Asymmetry Analyser | en |
| dc.contributor.institution | Particle Instruments and diagnostics | |
| dc.contributor.institution | School of Engineering and Technology | |
| dc.contributor.inventor | Ludlow, Ian | |
| dc.contributor.inventor | Kaye, Paul H. | |
| rioxxterms.type | Other | |
| herts.preservation.rarelyaccessed | true | |
