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dc.contributor.authorTenentes, Vasileios
dc.contributor.authorRossi, Daniele
dc.contributor.authorKhursheed, Saqib
dc.contributor.authorAl-Hashimi, Bashir M.
dc.contributor.authorChakrabarty, Krishnendu
dc.date.accessioned2018-06-08T15:32:46Z
dc.date.available2018-06-08T15:32:46Z
dc.date.issued2018-04-01
dc.identifier.citationTenentes , V , Rossi , D , Khursheed , S , Al-Hashimi , B M & Chakrabarty , K 2018 , ' Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs ' , IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol. 37 , no. 4 , pp. 883-895 . https://doi.org/10.1109/TCAD.2017.2729462
dc.identifier.issn0278-0070
dc.identifier.otherPURE: 12461546
dc.identifier.otherPURE UUID: af535a56-2a0b-4c16-9906-8f3f7385419c
dc.identifier.otherScopus: 85028890799
dc.identifier.urihttp://hdl.handle.net/2299/20174
dc.descriptionThis document is the Accepted Manuscript version of the following article: Vasileios Tenentes, Daniele Rossi, Saqib Khursheed, Bashir M. Al-Hashimi, and Krishnendu Chakrabarty, ‘Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs’, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, July 2017. © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
dc.description.abstractManufacturing defects that do not affect the functional operation of low power integrated circuits (ICs) can nevertheless impact their power saving capability. We show that stuck-ON faults on the power switches and resistive bridges between the power networks can impair the power saving capability of power-gating designs. For quantifying the impact of such faults on the power savings of power-gating designs, we propose a diagnosis technique that targets bridges between the power networks. The proposed technique is based on the static power analysis of a power-gating design in stand-by mode and it utilizes a novel on-chip signature generation unit, which is sensitive to the voltage level between power rails, the measurements of which are processed off-line for the diagnosis of bridges that can adversely affect power savings. We explore, through SPICE simulation of the largest IWLS'05 benchmarks synthesized using a 32 nm CMOS technology, the tradeoffs achieved by the proposed technique between diagnosis accuracy and area cost and we evaluate its robustness against process variation. The proposed technique achieves a diagnosis resolution that is higher than 98.6% and 97.9% for bridges of R 10 M (weak bridges) and bridges of R 10 M (strong bridges), respectively, and a diagnosis accuracy higher than 94.5% for all the examined defects. The area overhead is small and scalable: it is found to be 1.8% and 0.3% for designs with 27 K and 157 K gate equivalents, respectively.en
dc.format.extent13
dc.language.isoeng
dc.relation.ispartofIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
dc.rightsOpen
dc.subjectBridging faults
dc.subjectDiagnosis
dc.subjectFault grading
dc.subjectPower gating
dc.subjectStuck-ON faults
dc.subjectSoftware
dc.subjectComputer Graphics and Computer-Aided Design
dc.subjectElectrical and Electronic Engineering
dc.titleLeakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designsen
dc.contributor.institutionSchool of Engineering and Technology
dc.contributor.institutionCommunications and Intelligent Systems
dc.contributor.institutionCentre for Engineering Research
dc.description.statusPeer reviewed
dc.identifier.urlhttp://www.scopus.com/inward/record.url?scp=85028890799&partnerID=8YFLogxK
dc.description.versiontypeFinal Accepted Version
dcterms.dateAccepted2018-04-01
rioxxterms.versionAM
rioxxterms.versionofrecordhttps://doi.org/10.1109/TCAD.2017.2729462
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue
herts.rights.accesstypeOpen


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