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dc.contributor.authorHasan, Masood ul
dc.contributor.authorZhu, Yanqing
dc.contributor.authorSun, Yichuang
dc.date.accessioned2019-02-22T11:08:44Z
dc.date.available2019-02-22T11:08:44Z
dc.date.issued2016-10-04
dc.identifier.citationHasan , M U , Zhu , Y & Sun , Y 2016 , ' Design for testability of high-order OTA-C filters ' , International Journal of Circuit Theory and Applications , vol. 44 , no. 10 , pp. 1859-1873 . https://doi.org/10.1002/cta.2200
dc.identifier.issn0098-9886
dc.identifier.otherPURE: 11255556
dc.identifier.otherPURE UUID: 4ee4561f-b927-40b5-9d78-e4e190b83a60
dc.identifier.otherScopus: 84958259714
dc.identifier.urihttp://hdl.handle.net/2299/21148
dc.descriptionCopyright © 2016 John Wiley & Sons, Ltd.
dc.description.abstractA study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright Âen
dc.format.extent15
dc.language.isoeng
dc.relation.ispartofInternational Journal of Circuit Theory and Applications
dc.rightsEmbargoed
dc.subjectcircuit testing
dc.subjecthigh-order filter
dc.subjectoscillation-based test
dc.subjectOTA-C filter
dc.subjectElectronic, Optical and Magnetic Materials
dc.subjectComputer Science Applications
dc.subjectApplied Mathematics
dc.subjectElectrical and Electronic Engineering
dc.titleDesign for testability of high-order OTA-C filtersen
dc.contributor.institutionSmart Electronics Devices and Networks
dc.contributor.institutionRadio and Mobile Communication Systems
dc.contributor.institutionCentre for Engineering Research
dc.contributor.institutionSchool of Engineering and Technology
dc.contributor.institutionUniversity of Hertfordshire
dc.description.statusPeer reviewed
dc.date.embargoedUntil2017-02-12
dc.identifier.urlhttp://www.scopus.com/inward/record.url?scp=84958259714&partnerID=8YFLogxK
dc.relation.schoolSchool of Engineering and Technology
dc.description.versiontypeFinal Accepted Version
dcterms.dateAccepted2016-10-04
rioxxterms.versionAM
rioxxterms.versionofrecordhttps://doi.org/10.1002/cta.2200
rioxxterms.licenseref.uriOther
rioxxterms.licenseref.startdate2017-02-12
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue
herts.date.embargo2017-02-12
herts.rights.accesstypeEmbargoed


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