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Apparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light.

dc.date.accessioned2024-03-25T13:00:04Z
dc.date.available2024-03-25T13:00:04Z
dc.date.issued1995-11-28
dc.identifier.citationKaye , P & Hirst , E Nov. 28 1995 , Apparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light. , Patent No. US5471299 .
dc.identifier.otherORCID: /0000-0001-6950-4870/work/94250919
dc.identifier.urihttp://hdl.handle.net/2299/27476
dc.format.extent1557409
dc.language.isoeng
dc.subjectPCT/393,003,317
dc.titleApparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light.en
dc.contributor.institutionParticle Instruments and diagnostics
dc.contributor.inventorKaye, Paul
dc.contributor.inventorHirst, Edwin
rioxxterms.typeOther
herts.preservation.rarelyaccessedtrue


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