Show simple item record

Apparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light.

dc.date.accessioned2024-03-25T13:00:04Z
dc.date.available2024-03-25T13:00:04Z
dc.date.issued1995-11-28
dc.identifier.citationKaye , P & Hirst , E Nov. 28 1995 , Apparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light. , Patent No. US5471299 .
dc.identifier.otherORCID: /0000-0001-6950-4870/work/94250919
dc.identifier.urihttp://hdl.handle.net/2299/27476
dc.format.extent1557409
dc.language.isoeng
dc.subjectPCT/393,003,317
dc.titleApparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light.en
dc.contributor.institutionParticle Instruments and diagnostics
dc.contributor.institutionCentre for Research in Biodetection Technologies
dc.contributor.institutionCentre for Hazard Detection and Protection Research
dc.contributor.institutionCentre for Atmospheric and Climate Physics Research
dc.contributor.institutionSchool of Physics, Engineering & Computer Science
dc.contributor.institutionDepartment of Physics, Astronomy and Mathematics
dc.contributor.inventorKaye, Paul
dc.contributor.inventorHirst, Edwin
rioxxterms.typeOther
herts.preservation.rarelyaccessedtrue


Files in this item

Thumbnail
Name:
US5471299_Particle_characteris ...
Size:
1.485Mb
Format:
PDF
View/Open

This item appears in the following Collection(s)

Show simple item record