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Plagiarism is easy, but also easy to detect

dc.contributor.authorLyon, C.
dc.contributor.authorBarrett, R.
dc.contributor.authorMalcolm, J.
dc.date.accessioned2007-07-25T15:31:32Z
dc.date.available2007-07-25T15:31:32Z
dc.date.issued2006-01
dc.identifier.citationLyon , C , Barrett , R & Malcolm , J 2006 , ' Plagiarism is easy, but also easy to detect ' , Plagiary , vol. 1 , no. 5 , pp. 1-10 .
dc.identifier.issn1559-3096
dc.identifier.otherdspace: 2299/280
dc.identifier.urihttp://hdl.handle.net/2299/280
dc.format.extent319151
dc.language.isoeng
dc.relation.ispartofPlagiary
dc.subjectComputer Science
dc.titlePlagiarism is easy, but also easy to detecten
dc.contributor.institutionSchool of Computer Science
dc.contributor.institutionScience & Technology Research Institute
dc.contributor.institutionSchool of Engineering and Technology
dc.description.statusPeer reviewed
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue


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