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dc.contributor.authorSteuernagel, O.
dc.contributor.authorYao, E.
dc.contributor.authorO'Holleran, K.
dc.contributor.authorPadgett, M.
dc.date.accessioned2009-12-17T09:41:46Z
dc.date.available2009-12-17T09:41:46Z
dc.date.issued2005
dc.identifier.citationSteuernagel , O , Yao , E , O'Holleran , K & Padgett , M 2005 , ' Observation of Gouy-phase-induced transversal intensity changes in focused beams ' , Journal of Modern Optics , vol. 52 , no. 18 , pp. 2713-2721 . https://doi.org/10.1080/09500340500347121
dc.identifier.issn0950-0340
dc.identifier.otherPURE: 173234
dc.identifier.otherPURE UUID: fa773c38-7d7a-4185-be9b-f2f81584c749
dc.identifier.otherdspace: 2299/4108
dc.identifier.otherScopus: 29744467428
dc.identifier.urihttp://hdl.handle.net/2299/4108
dc.descriptionOriginal article can be found at: http://www.informaworld.com/smpp/title~content=t713191304 Copyright Informa / Taylor and Francis Group. [Full text of this article is not available in the UHRA]
dc.description.abstractWe created superpositions of two different TEM modes in focused beams. Such modes show relative dephasing along the beam axis due to Gouy's phase. This leads to interference effects and significant modifications of a beam's transverse intensity distribution near the beam focus. We investigate the features of the resulting field profiles.en
dc.language.isoeng
dc.relation.ispartofJournal of Modern Optics
dc.titleObservation of Gouy-phase-induced transversal intensity changes in focused beamsen
dc.contributor.institutionSchool of Physics, Astronomy and Mathematics
dc.contributor.institutionScience & Technology Research Institute
dc.description.statusPeer reviewed
rioxxterms.versionofrecordhttps://doi.org/10.1080/09500340500347121
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue


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