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Detection of a bright ridge in the 2.2 MU-M emission of M82
(1979)
Photometric scans through the central region of M82 with a resolution of 6 arcsec reveal that the 2.2-micron emission source has a compact ridge structure which is approximately aligned + or - 10 deg with the major axis ...
Hatfield near-infrared polarimeter
(1978)
The design of the Hatfield Polytechnic Observatory's near-infrared (IJHKLM) polarimeter is described and its performance iliustrated by some representative observations on bright standard stars. Preliminary measurements ...