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dc.contributor.authorKandl, S.
dc.contributor.authorKirner, Raimund
dc.contributor.authorPuschner, P.
dc.contributor.editorElmenreich, W
dc.contributor.editorNovak, G
dc.contributor.editorSeepold, RED
dc.date.accessioned2011-08-22T09:01:16Z
dc.date.available2011-08-22T09:01:16Z
dc.date.issued2006
dc.identifier.citationKandl , S , Kirner , R & Puschner , P 2006 , Development of a framework for automated systematic testing of safety-critical embedded systems . in W Elmenreich , G Novak & RED Seepold (eds) , Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems . IEEE , pp. 65-77 , 4th International Workshop on Intelligent Solutions in Embedded Systems (WISES 2006) , Vienna , 30/06/06 . https://doi.org/10.1109/WISES.2006.329116
dc.identifier.citationconference
dc.identifier.isbn3-902463-06-6
dc.identifier.otherPURE: 323848
dc.identifier.otherPURE UUID: c18962ed-db39-445a-8687-c608abdba263
dc.identifier.otherWOS: 000240794700006
dc.identifier.otherScopus: 36148966643
dc.identifier.urihttp://hdl.handle.net/2299/6329
dc.description“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”
dc.description.abstractIn this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.en
dc.format.extent13
dc.language.isoeng
dc.publisherIEEE
dc.relation.ispartofProceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems
dc.subjectTEST-CASE GENERATION
dc.subjectMODEL CHECKING
dc.titleDevelopment of a framework for automated systematic testing of safety-critical embedded systemsen
dc.contributor.institutionCentre for Computer Science and Informatics Research
dc.contributor.institutionDepartment of Computer Science
dc.contributor.institutionSchool of Engineering and Computer Science
rioxxterms.versionAM
rioxxterms.versionofrecordhttps://doi.org/10.1109/WISES.2006.329116
rioxxterms.typeOther
herts.preservation.rarelyaccessedtrue


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