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dc.contributor.authorTan, Y.
dc.contributor.authorHe, Y.
dc.contributor.authorSun, Yichuang
dc.identifier.citationTan , Y , He , Y & Sun , Y 2010 , ' Design of test stimuli and minimization of ambiguity in fault diagnosis of analogue circuits with tolerance ' , International Journal of Electronics , vol. 98 , no. 2 , pp. 173-183 .
dc.identifier.otherPURE: 392644
dc.identifier.otherPURE UUID: 5de3de4f-27ee-4264-ac00-a9c2cdc710cb
dc.identifier.otherScopus: 79751509494
dc.descriptionOriginal article can be found at: Copyright Taylor and Francis [Full text of this article is not available in the UHRA]
dc.description.abstractA novel method of stimuli design for analogue circuit fault diagnosis is presented based on a genetic algorithm and wavelet packet decomposition. The method is characterised by reduced fault ambiguity and more accurate fault classification. Computation is also reduced because the method does not require matrix inversion and calculation. The proposed method is suitable for transient and AC input sources and can be applied to both linear and nonlinear circuits.en
dc.relation.ispartofInternational Journal of Electronics
dc.subjectfault diagnosis
dc.subjectanalogue circuits
dc.subjectstimuli design
dc.titleDesign of test stimuli and minimization of ambiguity in fault diagnosis of analogue circuits with toleranceen
dc.contributor.institutionSchool of Engineering and Technology
dc.contributor.institutionScience & Technology Research Institute
dc.description.statusPeer reviewed
dc.relation.schoolSchool of Engineering and Technology
rioxxterms.typeJournal Article/Review

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