| dc.contributor.author | He, Y. | |
| dc.contributor.author | Tan, Y. | |
| dc.contributor.author | Sun, Y. | |
| dc.date.accessioned | 2011-10-25T09:01:26Z | |
| dc.date.available | 2011-10-25T09:01:26Z | |
| dc.date.issued | 2004 | |
| dc.identifier.citation | He , Y , Tan , Y & Sun , Y 2004 , Fault diagnosis of analog circuits based on wavelet packets . in Procs of the 2004 IEEE Region 10 Conference, TENCON . Institute of Electrical and Electronics Engineers (IEEE) , pp. 267-270 . https://doi.org/10.1109/TENCON.2004.1414408 | |
| dc.identifier.isbn | 0-7803-8560-8 | |
| dc.identifier.other | dspace: 2299/4755 | |
| dc.identifier.uri | http://hdl.handle.net/2299/6794 | |
| dc.description | “This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.” | |
| dc.description.abstract | A fault diagnosis method for analog circuits based on wavelet packets is developed in this paper. The sampled signals from the test nodes are decomposed by wavelet packets and the feature vectors extracted are applied to neural networks for identifying the faults. The proposed method is characterized by minimizing the ambiguity groups as well as simplifying neural network architecture, reducing training cost and maximizing the diagnosability. Simulation results of diagnosing a four-op-amp filter circuit have confirmed the validity of the propose technique. | en |
| dc.format.extent | 1912595 | |
| dc.language.iso | eng | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | |
| dc.relation.ispartof | Procs of the 2004 IEEE Region 10 Conference, TENCON | |
| dc.title | Fault diagnosis of analog circuits based on wavelet packets | en |
| dc.contributor.institution | School of Engineering and Technology | |
| dc.contributor.institution | Science & Technology Research Institute | |
| rioxxterms.versionofrecord | 10.1109/TENCON.2004.1414408 | |
| rioxxterms.type | Other | |
| herts.preservation.rarelyaccessed | true | |
