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dc.contributor.authorHasan, M.
dc.contributor.authorSun, Y.
dc.contributor.authorZhu, X.
dc.contributor.authorMoritz, J.
dc.date.accessioned2011-11-22T10:01:14Z
dc.date.available2011-11-22T10:01:14Z
dc.date.issued2008
dc.identifier.citationHasan , M , Sun , Y , Zhu , X & Moritz , J 2008 , Oscillation-based DFT for second-order OTA-C filters . in Procs IEEE Int Symposium on Circuits & Systems : ISCAS 2008 . IEEE , pp. 720-723 . https://doi.org/10.1109/ISCAS.2008.4541519
dc.identifier.isbn978-1-4244-1684-4
dc.identifier.otherPURE: 456994
dc.identifier.otherPURE UUID: 0207130d-b085-4c8e-a601-a4d25f06fcc2
dc.identifier.otherdspace: 2299/4743
dc.identifier.otherScopus: 51749125271
dc.identifier.urihttp://hdl.handle.net/2299/7069
dc.description“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”
dc.description.abstractWe propose an easily implemented and low-cost design-for-testability scheme for OTA-C filters based on an oscillation-based test (OBT) methodology. The OBT method is a vectorless output test strategy easily applicable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis and is effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two-integrator loop, Tow-Thomas and KHN OTA-C filters. Simulation results for 2nd order filters using a 0.25 mum CMOS technology show that the proposed oscillation-based test strategy has more than 96% fault coverage and, with a minimum number of extra components, requires a negligible area overhead.en
dc.language.isoeng
dc.publisherIEEE
dc.relation.ispartofProcs IEEE Int Symposium on Circuits & Systems
dc.rightsOpen
dc.titleOscillation-based DFT for second-order OTA-C filtersen
dc.contributor.institutionSchool of Engineering and Technology
dc.relation.schoolSchool of Engineering and Technology
dc.description.versiontypeFinal Published version
dcterms.dateAccepted2008
rioxxterms.versionVoR
rioxxterms.versionofrecordhttps://doi.org/10.1109/ISCAS.2008.4541519
rioxxterms.typeOther
herts.preservation.rarelyaccessedtrue
herts.rights.accesstypeOpen


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