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Calibrating program slicing metrics for practical use.

dc.contributor.authorBowes, D.
dc.contributor.authorCounsell, S.
dc.contributor.authorHall, Tracy
dc.date.accessioned2012-01-04T10:01:09Z
dc.date.available2012-01-04T10:01:09Z
dc.date.issued2009
dc.identifier.citationBowes , D , Counsell , S & Hall , T 2009 , Calibrating program slicing metrics for practical use. in 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART 2009) . Institute of Electrical and Electronics Engineers (IEEE) , TAIC PART 2009: Testing Academic & Industrial Conf - Practice & Research Techniques , Windsor , United Kingdom , 4/09/09 .
dc.identifier.citationconference
dc.identifier.isbn978-1-4244-497774
dc.identifier.otherBibtex: urn:cad237373d1cc4363bb4a4dd094e0076
dc.identifier.urihttp://hdl.handle.net/2299/7580
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartof2009 Testing: Academic and Industrial Conference - Practice and Research Techniques (TAIC PART 2009)
dc.titleCalibrating program slicing metrics for practical use.en
dc.contributor.institutionSchool of Computer Science
dc.contributor.institutionScience & Technology Research Institute
rioxxterms.typeOther
herts.preservation.rarelyaccessedtrue


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