| dc.contributor.author | He, Y. | |
| dc.contributor.author | Tan, Y. | |
| dc.contributor.author | Sun, Y. | |
| dc.date.accessioned | 2012-04-16T08:57:54Z | |
| dc.date.available | 2012-04-16T08:57:54Z | |
| dc.date.issued | 2003 | |
| dc.identifier.citation | He , Y , Tan , Y & Sun , Y 2003 , Class-based neural network method for fault location of large-scale analogue circuits . in Procs of the 2003 Int Symposium on Circuits and Systems : ISCAS '03 . vol. 5 , Institute of Electrical and Electronics Engineers (IEEE) , pp. 733-736 . https://doi.org/10.1109/ISCAS.2003.1206417 | |
| dc.identifier.other | dspace: 2299/4756 | |
| dc.identifier.uri | http://hdl.handle.net/2299/8317 | |
| dc.description | “This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.” | |
| dc.description.abstract | A new method for fault diagnosis of large-scale analogue circuits based on the class concept is developed in this paper. A large analogue circuit is decomposed into blocks/sub-circuits and the nodes between the blocks are classified into three classes. Only those sub-circuits related to the faulty class need to be treated. Node classification reduces the scope of search for faults, thus reduced after-test time. The proposed method is more suitable for real-time testing and can deal with both hard and soft faults. Tolerance effects are taken into account in the method. The class-based fault diagnosis principle and neural network based method are described in some details. Two non-trivial circuit examples are presented, showing that the proposed method is feasible. | en |
| dc.format.extent | 281397 | |
| dc.language.iso | eng | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | |
| dc.relation.ispartof | Procs of the 2003 Int Symposium on Circuits and Systems | |
| dc.title | Class-based neural network method for fault location of large-scale analogue circuits | en |
| dc.contributor.institution | School of Engineering and Technology | |
| dc.contributor.institution | Science & Technology Research Institute | |
| rioxxterms.versionofrecord | 10.1109/ISCAS.2003.1206417 | |
| rioxxterms.type | Other | |
| herts.preservation.rarelyaccessed | true | |
