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dc.contributor.authorPillay, Surosh
dc.contributor.authorAriyaeeinia, A.
dc.contributor.authorSivakumaran, P.
dc.contributor.authorPawlewski, M.
dc.date.accessioned2012-12-18T13:59:39Z
dc.date.available2012-12-18T13:59:39Z
dc.date.issued2012-06
dc.identifier.citationPillay , S , Ariyaeeinia , A , Sivakumaran , P & Pawlewski , M 2012 , ' Effective speaker verification via dynamic mismatch compensation ' , IET Biometrics , vol. 1 , no. 2 , pp. 130-135 . https://doi.org/10.1049/iet-bmt.2012.0001
dc.identifier.issn2047-4938
dc.identifier.otherPURE: 992113
dc.identifier.otherPURE UUID: 2da64798-b746-4dc5-b981-e8f8cd50eba1
dc.identifier.otherScopus: 84866860516
dc.identifier.urihttp://hdl.handle.net/2299/9446
dc.description.abstractThis paper presents a new approach to Condition-adjusted T-Norm (CT-Norm) for speaker verification under significant mismatched noise conditions. The study is motivated by the fact that, whilst the standard CT-Norm method offers enhanced accuracy under mismatched data conditions, its effectiveness reduces with the increased severity of such conditions. The proposed approach attempts to address this challenge by providing a more effective reduction of data mismatch through the incorporation of multi-SNR UBMs (universal background models). The effectiveness of the proposed approach is demonstrated through experiments based on examples of real-world noise. It is shown that the superiority of the approach over CT-Norm is particularly significant for such excessive levels of test data degradation considered in the study as 5 dB and below. The paper provides a description of the characteristics of the proposed approach and details the experimental analysis of its effectiveness under different noise conditions.en
dc.format.extent6
dc.language.isoeng
dc.relation.ispartofIET Biometrics
dc.subjectSpeaker verification; GMM-UBM; Multi-SNR GMM; Test-normalization
dc.titleEffective speaker verification via dynamic mismatch compensationen
dc.contributor.institutionHertfordshire Business School
dc.contributor.institutionSocial Sciences, Arts & Humanities Research Institute
dc.contributor.institutionSchool of Engineering and Technology
dc.contributor.institutionScience & Technology Research Institute
dc.contributor.institutionCentre for Engineering Research
dc.contributor.institutionDigital Media Processing and Biometrics
dc.contributor.institutionSmart Electronics Devices and Networks
dc.contributor.institutionCentre for Research on Management, Economy and Society
dc.contributor.institutionGroup for Research on Innovation and Enterprise
dc.description.statusPeer reviewed
rioxxterms.versionVoR
rioxxterms.versionofrecordhttps://doi.org/10.1049/iet-bmt.2012.0001
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue


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