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dc.contributor.authorUlanowski, Zbigniew
dc.contributor.authorHirst, Edwin
dc.contributor.authorKaye, Paul H.
dc.contributor.authorGreenaway, Richard
dc.date.accessioned2013-01-08T00:35:54Z
dc.date.available2013-01-08T00:35:54Z
dc.date.issued2012-12
dc.identifier.citationUlanowski , Z , Hirst , E , Kaye , P H & Greenaway , R 2012 , ' Retrieving the size of particles with rough and complex surfaces from two-dimensional scattering patterns ' , Journal of Quantitative Spectroscopy and Radiative Transfer , vol. 113 , no. 18 , pp. 2457-2464 . https://doi.org/10.1016/j.jqsrt.2012.06.019
dc.identifier.issn0022-4073
dc.identifier.otherORCID: /0000-0003-4761-6980/work/32374626
dc.identifier.otherORCID: /0000-0001-6950-4870/work/32371987
dc.identifier.otherORCID: /0000-0002-0073-8684/work/69424242
dc.identifier.urihttp://hdl.handle.net/2299/9504
dc.description.abstractScattered intensity measurement is a commonly used method for determining the size of small particles. However, it requires calibration and is subject to errors due to changes in incident irradiance or detector sensitivity. Analysis of two-dimensional scattering patterns offers an alternative approach. We test morphological image processing operations on patterns from a diverse range of particles with rough surfaces and/or complex structure, including mineral dust, spores, pollen, ice analogs and sphere clusters from 4 to 88 μm in size. It is found that the median surface area of intensity peaks is the most robust measure, and it is inversely proportional to particle size. The trend holds well for most particle types, as long as substantial roughness or complexity is present. One important application of this technique is the sizing of atmospheric particles, such as ice crystals.en
dc.format.extent8
dc.format.extent651781
dc.language.isoeng
dc.relation.ispartofJournal of Quantitative Spectroscopy and Radiative Transfer
dc.subjectrough
dc.subjectLight scattering
dc.subjectspeckle
dc.subjectparticle size
dc.subjectice
dc.titleRetrieving the size of particles with rough and complex surfaces from two-dimensional scattering patternsen
dc.contributor.institutionSchool of Physics, Astronomy and Mathematics
dc.contributor.institutionScience & Technology Research Institute
dc.contributor.institutionCentre for Atmospheric and Climate Physics Research
dc.contributor.institutionLight Scattering and Radiative Processes
dc.contributor.institutionParticle Instruments and diagnostics
dc.description.statusPeer reviewed
rioxxterms.versionofrecord10.1016/j.jqsrt.2012.06.019
rioxxterms.typeJournal Article/Review
herts.preservation.rarelyaccessedtrue


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