Fault diagnosis of analog circuits with tolerances using artificial neural networks

Deng, Y., He, Y. and Sun, Y. (2000) Fault diagnosis of analog circuits with tolerances using artificial neural networks. In: UNSPECIFIED.

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This paper proposes a method for analog fault diagnosis using neural networks. The primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of component tolerances and reduce testing time. The proposed approach is based on the k-fault diagnosis method and artificial backward propagation neural network. Simulation results show that the method is robust and fast for fault diagnosis of analog circuits with tolerances.

Item Type	Conference or Workshop Item (Other)
Identification Number	10.1109/APCCAS.2000.913491
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Date Deposited	15 May 2025 16:16
Last Modified	25 Feb 2026 00:05