Plagiarism is easy, but also easy to detect

Lyon, C., Barrett, R. and Malcolm, J. (2006) Plagiarism is easy, but also easy to detect. Plagiary, 1 (5). pp. 1-10. ISSN 1559-3096
Copy
Item Type Article
Keywords computer science
Date Deposited 15 May 2025 11:36
Last Modified 20 Sep 2025 23:02

Explore Further

picture_as_pdf
102992.pdf
View Download

Atom BibTeX OpenURL ContextObject in Span OpenURL ContextObject Dublin Core MPEG-21 DIDL Data Cite XML EndNote HTML Citation METS MODS RIOXX2 XML Reference Manager Refer ASCII Citation
Export

Downloads