Items where Author is "Tan, Y."

Item Type No Grouping

Article

Wavelet neural network approach for fault diagnosis of analogue circuits. (2004) Y. Sun, Y. He and Y. Tan

Design of test stimuli and minimization of ambiguity in fault diagnosis of analogue circuits with tolerance. (2010) Y. Tan, Y. He and Yichuang Sun

Data-fused method of fault diagnosis for analog circuits. (2009) Y. Tan, Y. He, Y. Sun, H. Yang and M. Liu

Conference or Workshop Item

Fault diagnosis of analog circuits based on wavelet packets. (2004) Y. He, Y. Tan and Y. Sun

Class-based neural network method for fault location of large-scale analogue circuits. (2003) Y. He, Y. Tan and Y. Sun

A neural network approach for fault diagnosis of large-scale analogue circuits. (2002) Y. He, Y. Tan and Y. Sun